Atomic force microscopy has long relied on the ability to acquire nanoscale chemical information while simultaneously characterizing nanomechanical properties. This article explores a new means of ...

Submicron and nanoscale chemical identification of semiconductor materials, particularly organic ones, poses a considerable challenge in the analysis of devices and also in the process control and ...

These developments continue to fuel growing investment into the technology and manufacture of semiconductor devices at both industrial and academic research levels. Improvements in technology, ...

Achieve rapid, accurate results with the Nicolet iS50 FT-IR spectrometer, which automates instrument setup and optimizes workflows for diverse analytical needs.