ATC 2.0 Option Enables Dynamic Multisite Sensing and Regulation of Device Temperature for Optimized Test of High-End Automotive SoCs TOKYO, Oct. 24, 2023 (GLOBE NEWSWIRE) -- Leading semiconductor test ...
TOKYO, Dec. 11, 2023 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced two new products designed to deliver advanced handling ...
SAN JOSE — At the Semicon West show here today, Credence Systems Corp. rolled out the world's first desktop test system that incorporates an automated device handler. The new desktop system, called ...
TOKYO, Dec. 10, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced the M5241 Memory Handler, its next-generation handler developed ...
Developing an automated production test solution for current and next-generation complex RF SIP/SOC devices is an increasingly difficult task. Both the test program and the device interface board (DIB ...
TOKYO, Oct. 24, 2023 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced a new Active Thermal Control (ATC) option for its M4841 ...
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