AZoNano

High Speed AFM Performance on Three Qualification Samples

This video shows the high speed performance of the atomic force microscope (AFM) from Bruker on the three qualification samples. The tip-check, Celgard and calibration grating are the three standard ...
AZoNano

Sample Scanning with the TT-AFM from AFM Workshop

This video (Part 3 of 3) provides a demonstration of the TT-AFM from AFM Workshop. It shows the entire process from loading a sample to obtaining results. The process involves the following steps: ...
Business Insider

Park Systems Introduces Park NX-TSH a High Resolution, Automated Tip Scanning Head (TSH) for Industrial Large Sample AFM at Semicon China and Semicon West

SANTA CLARA, Calif., June 23, 2020 /PRNewswire-PRWeb/ -- Park Systems Inc., world-leading manufacturer of Atomic Force Microscopes (AFM) is announcing Park NX-TSH, automated Tip Scan Head for large ...